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  5. Experimental and analytical study of geometry effects on the fatigue life of Al bond wire interconnects
 
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Experimental and analytical study of geometry effects on the fatigue life of Al bond wire interconnects

Publisher
Elsevier
Source
Microelectronics Reliability, Volume 53(9-11), 1558-1562
Journal
Microelectronics Reliability  
ISSN
0026-2714
Date Issued
2013-09
Author(s)
Czerny, Bernhard  
Khatibi, Golta 
Paul, Indrajit 
Thoben, Markus 
DOI
10.1016/j.microrel.2013.07.090
10.1109/ISPSD.2013.6694467
Abstract
The reliability of power electronic devices is mainly limited due to thermo-mechanical fatigue of the internal bond wire interconnections. The bond wire shape is already defined at the design stage of the device. Thus preliminary lifetime assessments become more and more important in order to satisfy the high quality demands and the short time to market of the devices. In this study a fast experimental test setup is used in order to determine the lifetime of a large number of wire bond shapes. Furthermore an analytical model is applied to calculate optimized wire bond shapes for a given set of parameters. The results of this investigation should help to optimize the shape parameters at an early stage of development using the presented analytical model in combination with the fatigue tests. © 2013 Elsevier Ltd. All rights reserved.
URI
http://hdl.handle.net/20.500.11790/1656
Type
Wissenschaftlicher Artikel

 

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